Surface Preparation of Uranium by Ion Milling
نویسندگان
چکیده
منابع مشابه
Ultrathin specimen preparation by a low-energy Ar-ion milling method.
The low-energy Ar-ion milling method was used to prepare ultrathin specimens for transmission electron microscope observation. The samples were thinned initially by a usual focused ion beam technique or typical Ar-ion milling with a high energy of 2-10 keV and were thinned additionally by an Ar-ion beam with an energy less than 1 keV, typically 500-900 eV. This low-energy ion beam was scanned o...
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Natural uranium (U) occurs as a mixture of three radioactive isotopes: U, U, and U. Only U is fissionable and makes up about 0.7% of natural U, while U is overwhelmingly the most abundant at greater than 99% of the total mass of U. Prior to the 1940s, U was predominantly used as a coloring agent, and U-bearing ores were mined mainly for their radium (Ra) and/or vanadium (V) content; the bulk of...
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Recent advances in focused ion beam technology have enabled high-resolution, maskless nanofabrication using light ions. Studies with light ions to date have, however, focused on milling of materials where sub-surface ion beam damage does not inhibit device performance. Here we report on maskless milling of single crystal diamond using a focused beam of oxygen ions. Material quality is assessed ...
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ژورنال
عنوان ژورنال: Microscopy Today
سال: 2008
ISSN: 1551-9295,2150-3583
DOI: 10.1017/s155192950005923x